Digital Library
Search Results: [ keyword: assessment ] (21)
Cho Hee Lee,
Eun Bin Kim,
Onseok Lee,
Eun Young Kim,
Vol. 13, No. 8, August 30, 2019
10.3837/tiis.2019.08.024
10.3837/tiis.2019.08.024
12.
No-reference Sharpness Index for Scanning Electron Microscopy Images Based on Dark Channel Prior
Qiaoyue Li,
Leida Li,
Zhaolin Lu,
Yu Zhou,
Hancheng Zhu,
Vol. 13, No. 5, May 30, 2019
10.3837/tiis.2019.05.016
10.3837/tiis.2019.05.016
Lanlan Rui,
Yao Zhang1,
Haoqiu Huang,
Xuesong Qiu,
Vol. 12, No. 1, January 30, 2018
10.3837/tiis.2018.01.003
10.3837/tiis.2018.01.003
Leida Li,
Dong Wu,
Jinjian Wu,
Jiansheng Qian1,
,
Beijing Chen,
Vol. 10, No. 1, January 30, 2016
10.3837/tiis.2016.01.017
10.3837/tiis.2016.01.017
Muhammad Umer Kakli,
Hassaan Saadat Qureshi,
Muhammad Murtaza Khan,
Rehan Hafiz,
Yongju Cho,
Unsang Park,
Vol. 9, No. 6, June 29, 2015
10.3837/tiis.2015.06.015
10.3837/tiis.2015.06.015
Dat Tien Nguyen,
Young Ho Park,
Kwang Yong Shin,
Kang Ryoung Park,
Vol. 7, No. 2, February 25, 2013
10.3837/tiis.2013.02.010
10.3837/tiis.2013.02.010
Sajad Khorsandroo,
Rafidah Md Noor,
Sayid Khorsandroo,
Vol. 7, No. 2, February 25, 2013
10.3837/tiis.2013.02.009
10.3837/tiis.2013.02.009