Digital Library
Search Results: [ keyword: assessment ] (26)
Rajeev Kumar,
Md Tarique Jamal Ansari,
Abdullah Baz,
Hosam Alhakami,
Alka Agrawal,
Raees Ahmad Khan,
Vol. 15, No. 1, January 31, 2021
10.3837/tiis.2021.01.014
Chenchen Sun,
Ziguan Cui,
Zongliang Gan,
Feng Liu,
Vol. 14, No. 10, October 31, 2020
10.3837/tiis.2020.10.008
Zhisen Tang,
Yuanlin Zheng,
Wei Wang,
Kaiyang Liao,
Vol. 14, No. 7, July 31, 2020
10.3837/tiis.2020.07.012
Gun-Yoon Shin,
Sung-Sam Hong,
Dong-Wook Kim,
Cheol-Hun Hwang,
Myung-Mook Han,
Hwayoung Kim,
Young jae Kim,
Vol. 14, No. 7, July 31, 2020
10.3837/tiis.2020.07.017
Haoting Liu,
Ming Lv,
Weiqun Yu,
Zhenhui Guo,
Xin Li,
Vol. 14, No. 3, March 31, 2020
10.3837/tiis.2020.03.008
Cho Hee Lee,
Eun Bin Kim,
Onseok Lee,
Eun Young Kim,
Vol. 13, No. 8, August 30, 2019
10.3837/tiis.2019.08.024
17.
No-reference Sharpness Index for Scanning Electron Microscopy Images Based on Dark Channel Prior
Qiaoyue Li,
Leida Li,
Zhaolin Lu,
Yu Zhou,
Hancheng Zhu,
Vol. 13, No. 5, May 30, 2019
10.3837/tiis.2019.05.016
Lanlan Rui,
Yao Zhang1,
Haoqiu Huang,
Xuesong Qiu,
Vol. 12, No. 1, January 30, 2018
10.3837/tiis.2018.01.003
Leida Li,
Dong Wu,
Jinjian Wu,
Jiansheng Qian1,
,
Beijing Chen,
Vol. 10, No. 1, January 30, 2016
10.3837/tiis.2016.01.017
