A fast defect detection method for PCBA based on YOLOv7

• Shugang Liu,
• Jialong Chen,
• Qiangguo Yu,
• Jie Zhan,
• Linan Duan,

Vol. 18, No. 8, August 31, 2024
10.3837/tiis.2024.08.008, Download Paper (Free):

• Object Detection
• Deep Learning
• YOLOv7
• Defect Detection

Abstract

To enhance the quality of defect detection for Printed Circuit Board Assembly (PCBA) during electronic product manufacturing, this study primarily focuses on optimizing the YOLOv7-based method for PCBA defect detection. In this method, the Mish, a smoother function, replaces the Leaky ReLU activation function of YOLOv7, effectively expanding the network's information processing capabilities. Concurrently, a Squeeze-and-Excitation attention mechanism (SEAM) has been integrated into the head of the model, significantly augmenting the precision of small target defect detection. Additionally, considering angular loss, compared to the CIoU loss function in YOLOv7, the SIoU loss function in the paper enhances robustness and training speed and optimizes inference accuracy. In terms of data preprocessing, this study has devised a brightness adjustment data enhancement technique based on split-filtering to enrich the dataset while minimizing the impact of noise and lighting on images. The experimental results under identical training conditions demonstrate that our model exhibits a 9.9% increase in mAP value and an FPS increase to 164 compared to the YOLOv7. These indicate that the method proposed has a superior performance in PCBA defect detection and has a specific application value.

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